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AFM probe
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51	Graphene Comprehensive AFM / Optical / Raman / TERS* Characterization in the Single Experiment White light image of the graphene flake with AFM tip and Raman laser spot Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2012-07-13 02:55:13 Scientific method Near-field scanning optical microscope Raman spectroscopy Graphene Atomic force microscopy Microscopy Microscope Magnetic force microscope Piezoresponse force microscopy Scanning probe microscopy Chemistry Science
52	Application Note 088 full Characterization of Materials with a Combined AFM/ Raman Microscope Marko Surtchev1, Sergei Magonov1 and Mark Wall2 1 Add to Reading List Source URL: ntmdt.com Language: English - Date: 2015-03-27 07:58:14 Scanning probe microscopy Microscopy Spectroscopy Microscopes Raman spectroscopy Intermolecular forces Raman scattering Chemical imaging Raman microscope Chemistry Science Scientific method
53	Application Note 088 full Characterization of Materials with a Combined AFM/ Raman Microscope Marko Surtchev1, Sergei Magonov1 and Mark Wall2 1 Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2015-03-27 07:58:14 Scanning probe microscopy Microscopy Spectroscopy Microscopes Raman spectroscopy Intermolecular forces Raman scattering Chemical imaging Raman microscope Chemistry Science Scientific method
54	Chapter 6: Materials Protection and Surface Technology Unique Test Facilities Atomic Force Microscope (AFM) and Tribometer in Ultra-high Vacuum Keywords Add to Reading List Source URL: www.bam.de Language: English - Date: 2015-02-04 09:11:39 Scanning probe microscopy Materials science Tribology Intermolecular forces Nanotechnology Atomic force microscopy Nanotribology Tribometer Friction Science Physics Chemistry
55	B.J. Jones “Commentary on “Evaluation of Shooting Distance by AFM and FTIR⁄ATR Analysis of GSR” Mou Y., Lakadwar J., Rabalais J.W., J. Forensic Sci. 2008; 53:1381-6” Journal of Forensic Sciences[removed]A Add to Reading List Source URL: bura.brunel.ac.uk Language: English - Date: 2014-11-01 08:12:27 Chemistry Atomic force microscopy Gunshot residue Microscopy Vibrational analysis with scanning probe microscopy Photothermal microspectroscopy Scanning probe microscopy Science Scientific method
56	Park Systems Hosts 2013 Annual Boston User Group Meeting, Luncheon, and Roadshow on Behalf of Atomic Force Microscopy (AFM) Oct 21 and 22 Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, an Add to Reading List Source URL: www.prweb.com Language: English - Date: 2013-10-08 17:00:14 Scanning probe microscopy Intermolecular forces Park Systems Atomic force microscopy Microscopy Agilent Technologies Canton of Neuchâtel NanoWorld Science Scientific method Technology
57	Microsoft Word - AFM-10-unpersoenlich.doc Add to Reading List Source URL: polymerscience.physik.hu-berlin.de Language: English - Date: 2011-12-05 13:32:51 Chemistry Atomic force microscopy Microscopy Cantilever Piezoelectricity Magnetic force microscope Chemical force microscopy Scanning probe microscopy Science Scientific method
58	Microsoft Word - AFM-10-unpersoenlich.doc Add to Reading List Source URL: polymerscience.physik.hu-berlin.de Language: English - Date: 2011-12-08 03:26:50 Chemistry Atomic force microscopy Microscopy Cantilever Piezoelectricity Magnetic force microscope Chemical force microscopy Scanning probe microscopy Science Scientific method
59	Process: Atomic Force Microscope (AFM) Protocol Introduction: The Atomic Force Microscope (AFM for short) is essentially a seismograph. There is a cantilever with a needle attached that runs over the surface o Add to Reading List Source URL: www.uwstout.edu Language: English - Date: 2011-10-28 14:09:31 Intermolecular forces Chemistry Nanotechnology Atomic force microscopy Microscope Cantilever Canton of Neuchâtel Photoconductive atomic force microscopy Scanning probe microscopy Science Scientific method
60	Advanced Robotics Journal, Vol. X, No. Y, 2002 (to appear) SCALED TELEOPERATION SYSTEM FOR NANO SCALE INTERACTION AND MANIPULATION Metin Sitti,1,∗ Baris Aruk,2 Hirohaki Shintani2 and Hideki Hashimoto2 1 Mechanical Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Technology Atomic force microscopy Scanning tunneling microscope Haptic technology AFM probe Contact mechanics Test probe Piezoelectricity Photoconductive atomic force microscopy Scanning probe microscopy Science Scientific method

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